Silver metallization : stability and reliability

• المؤلفون الرئيسيون: Adams, Daniel, Alford, Terry L., Mayer, James W.
• التنسيق: كتاب
• اللغة: English
• منشور في: Springer 2017
• الموضوعات: Chemistry; Materials Science ; Silver > Electrometallurgy ; Electrochemical metallizing ; Integrated circuits > Materials.; 669.23
• الوصول للمادة أونلاين: http://repository.vnu.edu.vn/handle/VNU_123/29863

"Silver has the lowest resistivity of all metals, which makes it an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits. Over the past ten years, extensive research has been conducted to address the thermal and electrical stability, a...