Monte Carlo simulations and DSP application for optical parameter measurement

The Texas Instrument TMS320VC55I0 DSK's calculation abilitiy with different program languages is investigated for minimum the DSP's measurement time. The steps of Monte Carlo simulations embedded into the DSK's flash through the DSK's JTAG interface for optical parameters meas...

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Bibliographic Details
Main Authors: Nguyen, Tuan Anh, Bach, Gia Duong, Nguyen, Xuan Thai
Format: Article
Language:English
Published: H. : ĐHQGHN 2017
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Online Access:http://repository.vnu.edu.vn/handle/VNU_123/56676
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Institution: Vietnam National University, Hanoi
Language: English

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