Monte Carlo simulations and DSP application for optical parameter measurement
The Texas Instrument TMS320VC55I0 DSK's calculation abilitiy with different program languages is investigated for minimum the DSP's measurement time. The steps of Monte Carlo simulations embedded into the DSK's flash through the DSK's JTAG interface for optical parameters meas...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
H. : ĐHQGHN
2017
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| Subjects: | |
| Online Access: | http://repository.vnu.edu.vn/handle/VNU_123/56676 |
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| Institution: | Vietnam National University, Hanoi |
| Language: | English |
| Summary: | The Texas Instrument TMS320VC55I0 DSK's calculation abilitiy with different
program languages is investigated for minimum the DSP's measurement time. The steps of Monte
Carlo simulations embedded into the DSK's flash through the DSK's JTAG interface for optical
parameters measurement including absorption coefficient7.t,, scattering coefficient F, and
anisotropy 8'are presented. The obtained results for diluted milk standard samples are also
reported. |
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