Monte Carlo simulations and DSP application for optical parameter measurement
The Texas Instrument TMS320VC55I0 DSK's calculation abilitiy with different program languages is investigated for minimum the DSP's measurement time. The steps of Monte Carlo simulations embedded into the DSK's flash through the DSK's JTAG interface for optical parameters meas...
محفوظ في:
المؤلفون الرئيسيون: | , , |
---|---|
التنسيق: | مقال |
اللغة: | English |
منشور في: |
H. : ĐHQGHN
2017
|
الموضوعات: | |
الوصول للمادة أونلاين: | http://repository.vnu.edu.vn/handle/VNU_123/56676 |
الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
|
المؤسسة: | Vietnam National University, Hanoi |
اللغة: | English |
الملخص: | The Texas Instrument TMS320VC55I0 DSK's calculation abilitiy with different
program languages is investigated for minimum the DSP's measurement time. The steps of Monte
Carlo simulations embedded into the DSK's flash through the DSK's JTAG interface for optical
parameters measurement including absorption coefficient7.t,, scattering coefficient F, and
anisotropy 8'are presented. The obtained results for diluted milk standard samples are also
reported. |
---|