Computerized electronic component tester

In the field of electronics, a single defect in component may contribute to the malfunction of the entire gadget. Although testing can be done manually, this process is time consuming and is more susceptible to error. Therefore, this thesis aims to design and construct an electronic component tester...

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Bibliographic Details
Main Authors: Bertulfo, Glen, Sy, Edward, Sy, Kenrick, Sy, Neilwin, Tsoi, Man Lung
Format: text
Language:English
Published: Animo Repository 1997
Subjects:
Online Access:https://animorepository.dlsu.edu.ph/etd_bachelors/6010
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Institution: De La Salle University
Language: English
Description
Summary:In the field of electronics, a single defect in component may contribute to the malfunction of the entire gadget. Although testing can be done manually, this process is time consuming and is more susceptible to error. Therefore, this thesis aims to design and construct an electronic component tester capable of testing both analog and digital components with the aid of a personal computer. The project consists of three major parts, these are the software, the interface card, and the hardware prototype. The software is programmed using Turbo C++ and is responsible to control the hardware prototype by sending commands through the interface card. The project is capable of testing both analog and digital components, specifically: transistors, diodes, SCR, IC and logic gates found in the laboratory. The software is able to determine a functioning component from a defective one. The result of the test is displayed on the monitor in text format. At the moment the project is capable of testing ICs with a maximum of fourteen pins. However, provisions were also made for future enhancements. With modifications on the software program and providing additional cards, the hardware prototype can be made to accommodate testing of components to as much as 64 pins.