Computerized electronic component tester

In the field of electronics, a single defect in component may contribute to the malfunction of the entire gadget. Although testing can be done manually, this process is time consuming and is more susceptible to error. Therefore, this thesis aims to design and construct an electronic component tester...

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Main Authors: Bertulfo, Glen, Sy, Edward, Sy, Kenrick, Sy, Neilwin, Tsoi, Man Lung
Format: text
Language:English
Published: Animo Repository 1997
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Online Access:https://animorepository.dlsu.edu.ph/etd_bachelors/6010
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Institution: De La Salle University
Language: English
id oai:animorepository.dlsu.edu.ph:etd_bachelors-6654
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spelling oai:animorepository.dlsu.edu.ph:etd_bachelors-66542021-07-15T05:35:16Z Computerized electronic component tester Bertulfo, Glen Sy, Edward Sy, Kenrick Sy, Neilwin Tsoi, Man Lung In the field of electronics, a single defect in component may contribute to the malfunction of the entire gadget. Although testing can be done manually, this process is time consuming and is more susceptible to error. Therefore, this thesis aims to design and construct an electronic component tester capable of testing both analog and digital components with the aid of a personal computer. The project consists of three major parts, these are the software, the interface card, and the hardware prototype. The software is programmed using Turbo C++ and is responsible to control the hardware prototype by sending commands through the interface card. The project is capable of testing both analog and digital components, specifically: transistors, diodes, SCR, IC and logic gates found in the laboratory. The software is able to determine a functioning component from a defective one. The result of the test is displayed on the monitor in text format. At the moment the project is capable of testing ICs with a maximum of fourteen pins. However, provisions were also made for future enhancements. With modifications on the software program and providing additional cards, the hardware prototype can be made to accommodate testing of components to as much as 64 pins. 1997-01-01T08:00:00Z text https://animorepository.dlsu.edu.ph/etd_bachelors/6010 Bachelor's Theses English Animo Repository Automatic checkout equipment Digital electronics Analog-to-digital converters Electronic digital computers--Circuits
institution De La Salle University
building De La Salle University Library
continent Asia
country Philippines
Philippines
content_provider De La Salle University Library
collection DLSU Institutional Repository
language English
topic Automatic checkout equipment
Digital electronics
Analog-to-digital converters
Electronic digital computers--Circuits
spellingShingle Automatic checkout equipment
Digital electronics
Analog-to-digital converters
Electronic digital computers--Circuits
Bertulfo, Glen
Sy, Edward
Sy, Kenrick
Sy, Neilwin
Tsoi, Man Lung
Computerized electronic component tester
description In the field of electronics, a single defect in component may contribute to the malfunction of the entire gadget. Although testing can be done manually, this process is time consuming and is more susceptible to error. Therefore, this thesis aims to design and construct an electronic component tester capable of testing both analog and digital components with the aid of a personal computer. The project consists of three major parts, these are the software, the interface card, and the hardware prototype. The software is programmed using Turbo C++ and is responsible to control the hardware prototype by sending commands through the interface card. The project is capable of testing both analog and digital components, specifically: transistors, diodes, SCR, IC and logic gates found in the laboratory. The software is able to determine a functioning component from a defective one. The result of the test is displayed on the monitor in text format. At the moment the project is capable of testing ICs with a maximum of fourteen pins. However, provisions were also made for future enhancements. With modifications on the software program and providing additional cards, the hardware prototype can be made to accommodate testing of components to as much as 64 pins.
format text
author Bertulfo, Glen
Sy, Edward
Sy, Kenrick
Sy, Neilwin
Tsoi, Man Lung
author_facet Bertulfo, Glen
Sy, Edward
Sy, Kenrick
Sy, Neilwin
Tsoi, Man Lung
author_sort Bertulfo, Glen
title Computerized electronic component tester
title_short Computerized electronic component tester
title_full Computerized electronic component tester
title_fullStr Computerized electronic component tester
title_full_unstemmed Computerized electronic component tester
title_sort computerized electronic component tester
publisher Animo Repository
publishDate 1997
url https://animorepository.dlsu.edu.ph/etd_bachelors/6010
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