Die attach box oven auto-load system: a six sigma solution for curing-related defects

• Main Authors: Antaran, Carlos, Crespo, Cynthia Crisanta V., Go, Jonathan T., Callanga, Raphael, Teope, Richard
• Format: text
• Language: English
• Published: Animo Repository 1995
• Subjects: Electronics > Materials; Semiconductors > Defects; Integrated circuits; Materials handling; Metal bonding; Machinery > Design; Automatic control; Electrical and Electronics
• Online Access: https://animorepository.dlsu.edu.ph/etd_bachelors/7222
• Institution: De La Salle University

Based on low-yielding lot analysis, human factors greatly contribute to the gross defects in the epoxy box oven curing process. The dependence of this process on human operators and material handlers leads to the occurrences of maverick lots. To address this problem, a prototype of an oven autoload...