Nano scale surface characterization of muscovite mica after contact electrification (CE) using tapping mode Kelvin force microscopy
Contact electrification (CE) between an n-type Si Atomic Force Microscope tip and a disk of a muscovite mica was demonstrated and characterized in the nanoscopic level using 300kHz tapping mode of Kevin Force Microscope (KFM). Band diagram of AFM tip and mica sample which can be modeled as a semicon...
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| Format: | text |
| Language: | English |
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Animo Repository
2017
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| Online Access: | https://animorepository.dlsu.edu.ph/etd_doctoral/591 |
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| Institution: | De La Salle University |
| Language: | English |