Thickness dependent valence fluctuation of CeN film

10.1016/j.susc.2004.09.004

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Bibliographic Details
Main Authors: Xiao, W., Guo, Q., Wang, E.G.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/98391
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Institution: National University of Singapore