Thickness dependent valence fluctuation of CeN film
10.1016/j.susc.2004.09.004
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sg-nus-scholar.10635-983912023-10-29T20:43:12Z Thickness dependent valence fluctuation of CeN film Xiao, W. Guo, Q. Wang, E.G. PHYSICS Auger electron spectroscopy Cerium Nitrides X-ray photoelectron spectroscopy 10.1016/j.susc.2004.09.004 Surface Science 572 2-3 296-300 SUSCA 2014-10-16T09:46:33Z 2014-10-16T09:46:33Z 2004-11-20 Article Xiao, W., Guo, Q., Wang, E.G. (2004-11-20). Thickness dependent valence fluctuation of CeN film. Surface Science 572 (2-3) : 296-300. ScholarBank@NUS Repository. https://doi.org/10.1016/j.susc.2004.09.004 00396028 http://scholarbank.nus.edu.sg/handle/10635/98391 000225425900018 Scopus |
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Auger electron spectroscopy Cerium Nitrides X-ray photoelectron spectroscopy |
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Auger electron spectroscopy Cerium Nitrides X-ray photoelectron spectroscopy Xiao, W. Guo, Q. Wang, E.G. Thickness dependent valence fluctuation of CeN film |
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10.1016/j.susc.2004.09.004 |
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PHYSICS |
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PHYSICS Xiao, W. Guo, Q. Wang, E.G. |
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Article |
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Xiao, W. Guo, Q. Wang, E.G. |
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Xiao, W. |
title |
Thickness dependent valence fluctuation of CeN film |
title_short |
Thickness dependent valence fluctuation of CeN film |
title_full |
Thickness dependent valence fluctuation of CeN film |
title_fullStr |
Thickness dependent valence fluctuation of CeN film |
title_full_unstemmed |
Thickness dependent valence fluctuation of CeN film |
title_sort |
thickness dependent valence fluctuation of cen film |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/98391 |
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