An innovative backside focused ion beam application for microelectronic devices failure analysis
Electrical and physical failure analysis is a key operation in the expanding and dynamic world of semiconductor product design and manufacturing. It has been known to contribute significantly to the enhancement of performance and reliability of a product, by giving valuable feedback to designers and...
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| Main Author: | |
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| Format: | text |
| Language: | English |
| Published: |
Animo Repository
2009
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| Online Access: | https://animorepository.dlsu.edu.ph/etd_masteral/3790 |
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| Institution: | De La Salle University |
| Language: | English |
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