Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC)
Saved in:
Main Author: | |
---|---|
Format: | text |
Language: | English |
Published: |
Animo Repository
2011
|
Online Access: | https://animorepository.dlsu.edu.ph/etd_masteral/4079 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | De La Salle University |
Language: | English |
id |
oai:animorepository.dlsu.edu.ph:etd_masteral-10917 |
---|---|
record_format |
eprints |
spelling |
oai:animorepository.dlsu.edu.ph:etd_masteral-109172020-12-14T02:44:09Z Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC) Merin, Jovencio V. 2011-01-01T08:00:00Z text https://animorepository.dlsu.edu.ph/etd_masteral/4079 Master's Theses English Animo Repository |
institution |
De La Salle University |
building |
De La Salle University Library |
continent |
Asia |
country |
Philippines Philippines |
content_provider |
De La Salle University Library |
collection |
DLSU Institutional Repository |
language |
English |
format |
text |
author |
Merin, Jovencio V. |
spellingShingle |
Merin, Jovencio V. Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC) |
author_facet |
Merin, Jovencio V. |
author_sort |
Merin, Jovencio V. |
title |
Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC) |
title_short |
Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC) |
title_full |
Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC) |
title_fullStr |
Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC) |
title_full_unstemmed |
Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC) |
title_sort |
microcontroller based robustness test device for microwave oven door system and interlocks at the bureau of product standards testing center (bpstc) |
publisher |
Animo Repository |
publishDate |
2011 |
url |
https://animorepository.dlsu.edu.ph/etd_masteral/4079 |
_version_ |
1772835928684888064 |