Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC)

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Bibliographic Details
Main Author: Merin, Jovencio V.
Format: text
Language:English
Published: Animo Repository 2011
Online Access:https://animorepository.dlsu.edu.ph/etd_masteral/4079
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Institution: De La Salle University
Language: English

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