Application of FFT in testing the sensitivity of a typical single-axis integrated circuit Hi-G MEMS accelerometer

Application of FFT in testing the sensitivity of a typical single-axis integrated circuit Hi-G MEMS accelerometer

MEMS or Microelectro-Mechanical Systems is a technology that integrates electrical and mechanical parts on a common substrate through the use of micro-fabrication techniques. This technology brings into reality a number of wonderful products such as inertial sensors (accelerometers), communications...

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Bibliographic Details
Main Author: Caguioa, Robert Z.
Format: text
Language:English
Published: Animo Repository 2005
Subjects:
Microelectromechanical systems
Fourier transformations
Gravimeters (Geophysical instruments)
Electrical and Electronics
Online Access:https://animorepository.dlsu.edu.ph/etd_masteral/6500
https://animorepository.dlsu.edu.ph/context/etd_masteral/article/12803/viewcontent/CDTG003883_P.pdf
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Institution: De La Salle University
Language: English

Internet

https://animorepository.dlsu.edu.ph/etd_masteral/6500
https://animorepository.dlsu.edu.ph/context/etd_masteral/article/12803/viewcontent/CDTG003883_P.pdf

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