Determination of the refractive index of tin telluride film using Terahertz spectroscopy
Tin telluride films were prepared and characterized using terahertz time domain spectroscopy. The films were deposited on glass substrate at different temperatures inside a vacuum chamber with a pressure of 10 -6 torr,\. The substrate temperatures were 30 degrees Centigrade and 50 degrees Centigrade...
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Format: | text |
Language: | English |
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Animo Repository
2003
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Online Access: | https://animorepository.dlsu.edu.ph/etd_masteral/3145 |
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Institution: | De La Salle University |
Language: | English |