Determination of the refractive index of tin telluride film using Terahertz spectroscopy

Tin telluride films were prepared and characterized using terahertz time domain spectroscopy. The films were deposited on glass substrate at different temperatures inside a vacuum chamber with a pressure of 10 -6 torr,\. The substrate temperatures were 30 degrees Centigrade and 50 degrees Centigrade...

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Bibliographic Details
Main Author: Diwa, Gilbert A.
Format: text
Language:English
Published: Animo Repository 2003
Subjects:
Online Access:https://animorepository.dlsu.edu.ph/etd_masteral/3145
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Institution: De La Salle University
Language: English
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