Two-dimensional polystyrene microsphere tracking by back focal plane detection
A quadrant photodiode positioned at the back-focal plane of a microscope is used for the lateral (two-dimensional) position of polystyrene microsphere under a microscope glass slide. The computer software and hardware interface Science Workshop 750 supplied by PASCO, Inc. were used in gathering and...
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oai:animorepository.dlsu.edu.ph:faculty_research-140882024-03-19T01:09:59Z Two-dimensional polystyrene microsphere tracking by back focal plane detection Siton, C. S. Yamson, J. M. Ayen, A. T. Pobre, Romeric F. A quadrant photodiode positioned at the back-focal plane of a microscope is used for the lateral (two-dimensional) position of polystyrene microsphere under a microscope glass slide. The computer software and hardware interface Science Workshop 750 supplied by PASCO, Inc. were used in gathering and evaluating data yielding calibration curves and micrometer measurements of actual position displacements of the particle. Resulting SNR values computed from the experiment range from 10 to 425. Furthermore, system resolutions for both x and y lateral positions were 1.051 volts/µm and 0.915-volts/µm respectively. 2004-01-01T08:00:00Z text https://animorepository.dlsu.edu.ph/faculty_research/12375 Faculty Research Work Animo Repository Polystyrene Particle tracking velocimetry Particle tracks (Nuclear physics) Physical Sciences and Mathematics Physics |
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Polystyrene Particle tracking velocimetry Particle tracks (Nuclear physics) Physical Sciences and Mathematics Physics |
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Polystyrene Particle tracking velocimetry Particle tracks (Nuclear physics) Physical Sciences and Mathematics Physics Siton, C. S. Yamson, J. M. Ayen, A. T. Pobre, Romeric F. Two-dimensional polystyrene microsphere tracking by back focal plane detection |
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A quadrant photodiode positioned at the back-focal plane of a microscope is used for the lateral (two-dimensional) position of polystyrene microsphere under a microscope glass slide. The computer software and hardware interface Science Workshop 750 supplied by PASCO, Inc. were used in gathering and evaluating data yielding calibration curves and micrometer measurements of actual position displacements of the particle. Resulting SNR values computed from the experiment range from 10 to 425. Furthermore, system resolutions for both x and y lateral positions were 1.051 volts/µm and 0.915-volts/µm respectively. |
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Siton, C. S. Yamson, J. M. Ayen, A. T. Pobre, Romeric F. |
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Siton, C. S. Yamson, J. M. Ayen, A. T. Pobre, Romeric F. |
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Siton, C. S. |
title |
Two-dimensional polystyrene microsphere tracking by back focal plane detection |
title_short |
Two-dimensional polystyrene microsphere tracking by back focal plane detection |
title_full |
Two-dimensional polystyrene microsphere tracking by back focal plane detection |
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Two-dimensional polystyrene microsphere tracking by back focal plane detection |
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Two-dimensional polystyrene microsphere tracking by back focal plane detection |
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two-dimensional polystyrene microsphere tracking by back focal plane detection |
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Animo Repository |
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2004 |
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https://animorepository.dlsu.edu.ph/faculty_research/12375 |
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