ANN diagnosis for defect detection and classification in two-layer printed circuit boards using supervised back-propagation algorithm

• Main Author: Caldo, Rionel Belen
• Format: text
• Published: Animo Repository 2021
• Subjects: Pattern recognition systems; Printed circuits—Defects; Printed circuits—Inspection; Neural networks (Computer science); Electrical and Computer Engineering; Electrical and Electronics
• Online Access: https://animorepository.dlsu.edu.ph/faculty_research/3918
• Institution: De La Salle University

In this work, the proponent makes use of Artificial Neural Network (ANN) to visually inspect and classify the defect found in two-layer Printed Circuit Boards (PCBs). The proponent trained and tested the data for pattern recognition using C language. The supervised back-propagation learning algorith...