Deep-learning-based X-ray CT slice analysis for layout verification in printed circuit boards

• Main Authors: Cheng, Deruo, Shi, Yiqiong, Tee, Yee Yang, Song, Jingsi, Wang, Xue, Wen, Bihan, Gwee, Bah Hwee
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2024
• Subjects: Engineering; Printed circuit boards; Hardware security
• Online Access: https://hdl.handle.net/10356/173858
• Institution: Nanyang Technological University

3D X-ray Computational Tomography (CT) systems have been employed to inspect Printed Circuit Boards (PCB) for security analysis, considering the heightened trustworthiness concern on the globalized supply chain. In this paper, we propose a deep-learning-based layout verification (DELVer) framework t...