Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

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Bibliographic Details
Main Authors: Kou, Lili, Ma, Zongmin, Li, Yan Jun, Naitoh, Yoshitaka, Komiyama, Masaharu, Sugawara, Yasuhiro
Format: Article
Published: IOP Publishing 2015
Online Access:http://scholars.utp.edu.my/id/eprint/35493/
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Institution: Universiti Teknologi Petronas

Internet

http://scholars.utp.edu.my/id/eprint/35493/

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