Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback
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oai:scholars.utp.edu.my:354932023-04-06T03:57:38Z http://scholars.utp.edu.my/id/eprint/35493/ Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback Kou, Lili Ma, Zongmin Li, Yan Jun Naitoh, Yoshitaka Komiyama, Masaharu Sugawara, Yasuhiro IOP Publishing 2015 Article NonPeerReviewed Kou, Lili and Ma, Zongmin and Li, Yan Jun and Naitoh, Yoshitaka and Komiyama, Masaharu and Sugawara, Yasuhiro (2015) Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback. Nanotechnology, 26 (19). p. 195701. |
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Kou, Lili Ma, Zongmin Li, Yan Jun Naitoh, Yoshitaka Komiyama, Masaharu Sugawara, Yasuhiro |
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Kou, Lili Ma, Zongmin Li, Yan Jun Naitoh, Yoshitaka Komiyama, Masaharu Sugawara, Yasuhiro Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback |
author_facet |
Kou, Lili Ma, Zongmin Li, Yan Jun Naitoh, Yoshitaka Komiyama, Masaharu Sugawara, Yasuhiro |
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Kou, Lili |
title |
Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback |
title_short |
Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback |
title_full |
Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback |
title_fullStr |
Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback |
title_full_unstemmed |
Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback |
title_sort |
surface potential imaging with atomic resolution by frequency-modulation kelvin probe force microscopy without bias voltage feedback |
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IOP Publishing |
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2015 |
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http://scholars.utp.edu.my/id/eprint/35493/ |
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