Methodology of statistical RTS noise analysis with charge-carrier trapping models

Methodology of statistical RTS noise analysis with charge-carrier trapping models

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Bibliographic Details
Main Authors: Tang, Tong Boon, Murray, Alan F, Roy, Scott
Format: Article
Published: IEEE 2010
Online Access:http://scholars.utp.edu.my/id/eprint/36597/
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Institution: Universiti Teknologi Petronas

Internet

http://scholars.utp.edu.my/id/eprint/36597/

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