Methodology of statistical RTS noise analysis with charge-carrier trapping models
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oai:scholars.utp.edu.my:365972023-06-19T04:19:08Z http://scholars.utp.edu.my/id/eprint/36597/ Methodology of statistical RTS noise analysis with charge-carrier trapping models Tang, Tong Boon Murray, Alan F Roy, Scott IEEE 2010 Article NonPeerReviewed Tang, Tong Boon and Murray, Alan F and Roy, Scott (2010) Methodology of statistical RTS noise analysis with charge-carrier trapping models. IEEE Transactions on Circuits and Systems I: Regular Papers, 57 (5). pp. 1062-1070. |
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Tang, Tong Boon Murray, Alan F Roy, Scott |
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Tang, Tong Boon Murray, Alan F Roy, Scott Methodology of statistical RTS noise analysis with charge-carrier trapping models |
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Tang, Tong Boon Murray, Alan F Roy, Scott |
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Tang, Tong Boon |
title |
Methodology of statistical RTS noise analysis with charge-carrier trapping models |
title_short |
Methodology of statistical RTS noise analysis with charge-carrier trapping models |
title_full |
Methodology of statistical RTS noise analysis with charge-carrier trapping models |
title_fullStr |
Methodology of statistical RTS noise analysis with charge-carrier trapping models |
title_full_unstemmed |
Methodology of statistical RTS noise analysis with charge-carrier trapping models |
title_sort |
methodology of statistical rts noise analysis with charge-carrier trapping models |
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IEEE |
publishDate |
2010 |
url |
http://scholars.utp.edu.my/id/eprint/36597/ |
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