Interface Test Adapter (ITA) Design for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Cycle Time

• Main Authors: Malabanan, Francis, Abu, Patricia Angela R, Oppus, Carlos, Reyes, Rosula SJ
• 格式: text
• 出版: Archīum Ateneo 2019
• 主題: automatic test equipment; electrostatic discharge; failure analysis; integrated circuit reliability; integrated circuit testing; microcontrollers; semiconductor diodes; surge protection; transients; Computer Engineering; Electrical and Computer Engineering; Electronic Devices and Semiconductor Manufacturing
• 在線閱讀: https://archium.ateneo.edu/ecce-faculty-pubs/38; https://ieeexplore.ieee.org/document/8942726
• 機構: Ateneo De Manila University

The advancement in semiconductor circuit design, particularly its miniaturization has increased the circuit sensitivity to electrical stresses. To protect the circuits, transient voltage suppressor (TVS) diodes are used. This device must be tested with the use of high-power tester that is capable to...