Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time

Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time

The advancement in semiconductor circuit design, particularly its miniaturization has increased the circuit sensitivity to electrical stresses. To protect the circuits, transient voltage suppressor (TVS) diodes are used. This device must be tested with the use of high-power tester that is capable to...

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Bibliographic Details
Main Authors: Malabanan, Francis, Abu, Patricia Angela R, Oppus, Carlos M, Reyes, Rosula SJ
Format: text
Published: Archīum Ateneo 2019
Subjects:
TV
Surge protection
Manuals
Semiconductor diodes
Transient analysis
Surges
Testing
cycle time
transient voltage suppressor (TVS) diode
interface test adapter (ITA)
Computer Sciences
Databases and Information Systems
Online Access:https://archium.ateneo.edu/discs-faculty-pubs/302
https://ieeexplore.ieee.org/document/8942726
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Institution: Ateneo De Manila University

Internet

https://archium.ateneo.edu/discs-faculty-pubs/302
https://ieeexplore.ieee.org/document/8942726

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