Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
The advancement in semiconductor circuit design, particularly its miniaturization has increased the circuit sensitivity to electrical stresses. To protect the circuits, transient voltage suppressor (TVS) diodes are used. This device must be tested with the use of high-power tester that is capable to...
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| Main Authors: | , , , |
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| Format: | text |
| Published: |
Archīum Ateneo
2019
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| Subjects: | |
| Online Access: | https://archium.ateneo.edu/discs-faculty-pubs/302 https://ieeexplore.ieee.org/document/8942726 |
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| Institution: | Ateneo De Manila University |