Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time

The advancement in semiconductor circuit design, particularly its miniaturization has increased the circuit sensitivity to electrical stresses. To protect the circuits, transient voltage suppressor (TVS) diodes are used. This device must be tested with the use of high-power tester that is capable to...

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Main Authors: Malabanan, Francis, Abu, Patricia Angela R, Oppus, Carlos M, Reyes, Rosula SJ
Format: text
Published: Archīum Ateneo 2019
Subjects:
TV
Online Access:https://archium.ateneo.edu/discs-faculty-pubs/302
https://ieeexplore.ieee.org/document/8942726
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Institution: Ateneo De Manila University
id ph-ateneo-arc.discs-faculty-pubs-1297
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spelling ph-ateneo-arc.discs-faculty-pubs-12972023-02-20T03:39:33Z Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time Malabanan, Francis Abu, Patricia Angela R Oppus, Carlos M Reyes, Rosula SJ The advancement in semiconductor circuit design, particularly its miniaturization has increased the circuit sensitivity to electrical stresses. To protect the circuits, transient voltage suppressor (TVS) diodes are used. This device must be tested with the use of high-power tester that is capable to surge high inrush power. In a test manufacturing company that employs manual testing of TVS diodes, the cycle time increases which results to a decrease in the number of unit per hour (UPH). In this study the, the Design for Six Sigma (DFSS) methodology is used to develop an interface test adapter (ITA) that is interconnected between a manual test machine and the unit under test (UUT). The ITA consists of an electromechanical relay (EMR) for switching, a linear actuator for mechanical shifting, and an Arduino-based microcontroller. The ITA is used to automate the testing of eight bidirectional TVS diodes device in a single unit of vertical array package to reduce the test cycle time. This also minimizes human intervention that avoids human handling error and lowers the chances of possible injuries that might happen during the process. Results show that there is sufficient improvement in the test cycle time. 2019-10-01T07:00:00Z text https://archium.ateneo.edu/discs-faculty-pubs/302 https://ieeexplore.ieee.org/document/8942726 Department of Information Systems & Computer Science Faculty Publications Archīum Ateneo TV Surge protection Manuals Semiconductor diodes Transient analysis Surges Testing cycle time transient voltage suppressor (TVS) diode interface test adapter (ITA) Computer Sciences Databases and Information Systems
institution Ateneo De Manila University
building Ateneo De Manila University Library
continent Asia
country Philippines
Philippines
content_provider Ateneo De Manila University Library
collection archium.Ateneo Institutional Repository
topic TV
Surge protection
Manuals
Semiconductor diodes
Transient analysis
Surges
Testing
cycle time
transient voltage suppressor (TVS) diode
interface test adapter (ITA)
Computer Sciences
Databases and Information Systems
spellingShingle TV
Surge protection
Manuals
Semiconductor diodes
Transient analysis
Surges
Testing
cycle time
transient voltage suppressor (TVS) diode
interface test adapter (ITA)
Computer Sciences
Databases and Information Systems
Malabanan, Francis
Abu, Patricia Angela R
Oppus, Carlos M
Reyes, Rosula SJ
Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
description The advancement in semiconductor circuit design, particularly its miniaturization has increased the circuit sensitivity to electrical stresses. To protect the circuits, transient voltage suppressor (TVS) diodes are used. This device must be tested with the use of high-power tester that is capable to surge high inrush power. In a test manufacturing company that employs manual testing of TVS diodes, the cycle time increases which results to a decrease in the number of unit per hour (UPH). In this study the, the Design for Six Sigma (DFSS) methodology is used to develop an interface test adapter (ITA) that is interconnected between a manual test machine and the unit under test (UUT). The ITA consists of an electromechanical relay (EMR) for switching, a linear actuator for mechanical shifting, and an Arduino-based microcontroller. The ITA is used to automate the testing of eight bidirectional TVS diodes device in a single unit of vertical array package to reduce the test cycle time. This also minimizes human intervention that avoids human handling error and lowers the chances of possible injuries that might happen during the process. Results show that there is sufficient improvement in the test cycle time.
format text
author Malabanan, Francis
Abu, Patricia Angela R
Oppus, Carlos M
Reyes, Rosula SJ
author_facet Malabanan, Francis
Abu, Patricia Angela R
Oppus, Carlos M
Reyes, Rosula SJ
author_sort Malabanan, Francis
title Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
title_short Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
title_full Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
title_fullStr Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
title_full_unstemmed Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
title_sort design of an interface test adapter for sequential testing of transient voltage suppressor diodes to reduce test cycle time
publisher Archīum Ateneo
publishDate 2019
url https://archium.ateneo.edu/discs-faculty-pubs/302
https://ieeexplore.ieee.org/document/8942726
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