Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time

• Main Authors: Malabanan, Francis, Abu, Patricia Angela R, Oppus, Carlos M, Reyes, Rosula SJ
• 格式: text
• 出版: Archīum Ateneo 2019
• 主題: TV; Surge protection; Manuals; Semiconductor diodes; Transient analysis; Surges; Testing; cycle time; transient voltage suppressor (TVS) diode; interface test adapter (ITA); Computer Sciences; Databases and Information Systems
• 在線閱讀: https://archium.ateneo.edu/discs-faculty-pubs/302; https://ieeexplore.ieee.org/document/8942726
• 機構: Ateneo De Manila University

The advancement in semiconductor circuit design, particularly its miniaturization has increased the circuit sensitivity to electrical stresses. To protect the circuits, transient voltage suppressor (TVS) diodes are used. This device must be tested with the use of high-power tester that is capable to...