An analysis of a VLSI test software speed optimization methods for semiconductor manufacturing

• Main Author: Manongdo, Irene R.
• Format: text
• Language: English
• Published: Animo Repository 1998
• Subjects: Integrated circuits > Very large scale integration; Transputers; Systolic array circuits; Semiconductor industry; Electronic Devices and Semiconductor Manufacturing
• Online Access: https://animorepository.dlsu.edu.ph/etd_masteral/2493; https://animorepository.dlsu.edu.ph/context/etd_masteral/article/9331/viewcontent/TG03107_F_Partial.pdf
• Institution: De La Salle University

This practicum project focuses on the minimization of very large system integration (VLSI) test execution times for improving production-mode electrical screening of custom integrated circuits without sacrificing quality. The reduction of test time leads to maximizing profits and minimizing costs. T...