An analysis of a VLSI test software speed optimization methods for semiconductor manufacturing

This practicum project focuses on the minimization of very large system integration (VLSI) test execution times for improving production-mode electrical screening of custom integrated circuits without sacrificing quality. The reduction of test time leads to maximizing profits and minimizing costs. T...

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Bibliographic Details
Main Author: Manongdo, Irene R.
Format: text
Language:English
Published: Animo Repository 1998
Subjects:
Online Access:https://animorepository.dlsu.edu.ph/etd_masteral/2493
https://animorepository.dlsu.edu.ph/context/etd_masteral/article/9331/viewcontent/TG03107_F_Partial.pdf
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Institution: De La Salle University
Language: English

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