A functional failure detection method for semiconductor design safety verification

As the function of SoC becomes more and more powerful, its design complexity is also increasing, the overall circuit complexity will inevitably increase safety risks. Therefore, for the verification work of SoC, functional safety verification has been receiving greater attention. Efficient and compl...

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Bibliographic Details
Main Author: Hai, Zhuoran
Other Authors: Meng-Hiot Lim
Format: Thesis-Master by Coursework
Language:English
Published: Nanyang Technological University 2023
Subjects:
Online Access:https://hdl.handle.net/10356/166551
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Institution: Nanyang Technological University
Language: English