A functional failure detection method for semiconductor design safety verification

• Main Author: Hai, Zhuoran
• Other Authors: Meng-Hiot Lim
• Format: Thesis-Master by Coursework
• Language: English
• Published: Nanyang Technological University 2023
• Subjects: Engineering::Electrical and electronic engineering::Integrated circuits
• Online Access: https://hdl.handle.net/10356/166551
• Institution: Nanyang Technological University

As the function of SoC becomes more and more powerful, its design complexity is also increasing, the overall circuit complexity will inevitably increase safety risks. Therefore, for the verification work of SoC, functional safety verification has been receiving greater attention. Efficient and compl...