An analysis of a VLSI test software speed optimization methods for semiconductor manufacturing

An analysis of a VLSI test software speed optimization methods for semiconductor manufacturing

This practicum project focuses on the minimization of very large system integration (VLSI) test execution times for improving production-mode electrical screening of custom integrated circuits without sacrificing quality. The reduction of test time leads to maximizing profits and minimizing costs. T...

Full description

Saved in:
Bibliographic Details
Main Author: Manongdo, Irene R.
Format: text
Language:English
Published: Animo Repository 1998
Subjects:
Integrated circuits > Very large scale integration
Transputers
Systolic array circuits
Semiconductor industry
Electronic Devices and Semiconductor Manufacturing
Online Access:https://animorepository.dlsu.edu.ph/etd_masteral/2493
https://animorepository.dlsu.edu.ph/context/etd_masteral/article/9331/viewcontent/TG03107_F_Partial.pdf
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: De La Salle University
Language: English
Description
Summary:This practicum project focuses on the minimization of very large system integration (VLSI) test execution times for improving production-mode electrical screening of custom integrated circuits without sacrificing quality. The reduction of test time leads to maximizing profits and minimizing costs. The project aims to fully analyze the Trillium test programs and evaluate its impact on the test execution time and to find out whether or not it has benefit to the company.

Similar Items