Mapping polarons in polymer FETs by charge modulation microscopy in the mid-infrared
We implemented spatial mapping of charge carrier density in the channel of a conventional polymer Field-Effect Transistor (FET) by mid-infrared Charge Modulation Spectroscopy (CMS). CMS spectra are recorded with a high sensitivity confocal Fourier Transform Infra-Red (FTIR) microscope by probing ele...
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Main Authors: | , , , , |
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格式: | Article |
語言: | English |
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2014
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在線閱讀: | https://hdl.handle.net/10356/102329 http://hdl.handle.net/10220/18976 |
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