Mapping polarons in polymer FETs by charge modulation microscopy in the mid-infrared

We implemented spatial mapping of charge carrier density in the channel of a conventional polymer Field-Effect Transistor (FET) by mid-infrared Charge Modulation Spectroscopy (CMS). CMS spectra are recorded with a high sensitivity confocal Fourier Transform Infra-Red (FTIR) microscope by probing ele...

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Bibliographic Details
Main Authors: Chin, Xin Yu, Yin, Jun, Wang, Zilong, Caironi, Mario, Soci, Cesare
Other Authors: School of Physical and Mathematical Sciences
Format: Article
Language:English
Published: 2014
Subjects:
Online Access:https://hdl.handle.net/10356/102329
http://hdl.handle.net/10220/18976
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Institution: Nanyang Technological University
Language: English