Mapping polarons in polymer FETs by charge modulation microscopy in the mid-infrared

• المؤلفون الرئيسيون: Chin, Xin Yu, Yin, Jun, Wang, Zilong, Caironi, Mario, Soci, Cesare
• مؤلفون آخرون: School of Physical and Mathematical Sciences
• التنسيق: مقال
• اللغة: English
• منشور في: 2014
• الموضوعات: DRNTU::Engineering::Computer science and engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/102329; http://hdl.handle.net/10220/18976

We implemented spatial mapping of charge carrier density in the channel of a conventional polymer Field-Effect Transistor (FET) by mid-infrared Charge Modulation Spectroscopy (CMS). CMS spectra are recorded with a high sensitivity confocal Fourier Transform Infra-Red (FTIR) microscope by probing ele...