Smart three-dimensional machine vision

Three-dimensional inspection is increasingly being demanded by industry in various sectors and none more so than in wafer fabs. While there are many three-dimensional surface measuring instruments, there is still a gap to their adoption in the industry due to lack of methodologies for measuring larg...

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Bibliographic Details
Main Author: Huang, Chongtian
Other Authors: Anand Krishna Asundi
Format: Theses and Dissertations
Language:English
Published: 2019
Subjects:
Online Access:https://hdl.handle.net/10356/102839
http://hdl.handle.net/10220/48588
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Institution: Nanyang Technological University
Language: English
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