The X control chart for monitoring process shifts in mean and variance

• Main Authors: Khoo, Michael B. C., Yang, Mei, Wu, Zhang, Lee, Ka Man
• Other Authors: School of Mechanical and Aerospace Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Mechanical engineering
• Online Access: https://hdl.handle.net/10356/102848; http://hdl.handle.net/10220/16878
• Institution: Nanyang Technological University

Control charts are widely used in statistical process control (SPC) to monitor the quality of products or production processes. When dealing with a variable (e.g., the diameter of a shaft, the hardness of a component surface), it is necessary to monitor both its mean and variability (Montgomery 2009...