The X control chart for monitoring process shifts in mean and variance
Control charts are widely used in statistical process control (SPC) to monitor the quality of products or production processes. When dealing with a variable (e.g., the diameter of a shaft, the hardness of a component surface), it is necessary to monitor both its mean and variability (Montgomery 2009...
Saved in:
Main Authors: | Khoo, Michael B. C., Yang, Mei, Wu, Zhang, Lee, Ka Man |
---|---|
Other Authors: | School of Mechanical and Aerospace Engineering |
Format: | Article |
Language: | English |
Published: |
2013
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/102848 http://hdl.handle.net/10220/16878 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Cumulative sum control charts for monitoring process mean and/or variance
by: Yang, Mei
Published: (2012) -
Control charts for monitoring process mean and variance
by: Tian, Yu.
Published: (2008) -
Adaptive control charts for monitoring process mean and variance
by: Wang, Peng Hui
Published: (2008) -
An adaptive CUSUM chart with single sample size for monitoring process mean and variance
by: Ou, Yanjing, et al.
Published: (2013) -
The effect of shift distribution on the design and performance of the X and CUSUM charts in monitoring mean and variability
by: Liu, Tien-I., et al.
Published: (2013)