The X control chart for monitoring process shifts in mean and variance

• المؤلفون الرئيسيون: Khoo, Michael B. C., Yang, Mei, Wu, Zhang, Lee, Ka Man
• مؤلفون آخرون: School of Mechanical and Aerospace Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2013
• الموضوعات: DRNTU::Engineering::Mechanical engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/102848; http://hdl.handle.net/10220/16878

Control charts are widely used in statistical process control (SPC) to monitor the quality of products or production processes. When dealing with a variable (e.g., the diameter of a shaft, the hardness of a component surface), it is necessary to monitor both its mean and variability (Montgomery 2009...