Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms, and challenges

• Main Authors: Shi, Yiyu, He, Lei, Yu, Hao, Gong, Fang
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2015
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/102890; http://hdl.handle.net/10220/25713
• Institution: Nanyang Technological University

With technology scaling down to 90nm and below, process variation has become a primary challenge for both design and fabrication of analog/mixed-signal circuits due to significantly increased circuit failures and yield loss. As a result, it is urgently required to estimate the yield of one design ef...