Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges

• Main Authors: Gong, Fang, Shi, Yiyu, Yu, Hao, He, Lei
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2014
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/103120; http://hdl.handle.net/10220/19252
• Institution: Nanyang Technological University

With technology scaling down to 90nm and below, process variation has become a primary challenge for both design and fabrication of analog/mixed-signal circuits due to significantly increased circuit failures and yield loss. As a result, it is urgently required to estimate the yield of one design ef...