Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter

In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure...

Full description

Saved in:

Bibliographic Details
Main Authors:	Tan, Cher Ming, Yu, Wen Zhi
Other Authors:	School of Electrical and Electronic Engineering
Format:	Article
Language:	English
Published:	2014
Subjects:	DRNTU::Engineering::Electrical and electronic engineering
Online Access:	https://hdl.handle.net/10356/103593 http://hdl.handle.net/10220/19346
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	Nanyang Technological University
Language:	English

id	sg-ntu-dr.10356-103593
record_format	dspace
spelling	sg-ntu-dr.10356-1035932020-03-07T14:00:37Z Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter Tan, Cher Ming Yu, Wen Zhi School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure sites before destructive physical analysis of the degraded limiters. 2014-05-15T06:38:07Z 2019-12-06T21:16:03Z 2014-05-15T06:38:07Z 2019-12-06T21:16:03Z 2014 2014 Journal Article Tan, C. M., & Yu, W. Z. (2014). Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter. Microelectronics Reliability, 54(5), 960-964. 0026-2714 https://hdl.handle.net/10356/103593 http://hdl.handle.net/10220/19346 10.1016/j.microrel.2014.01.009 178878 en Microelectronics reliability © 2014 Elsevier Ltd.
institution	Nanyang Technological University
building	NTU Library
country	Singapore
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Electrical and electronic engineering
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering Tan, Cher Ming Yu, Wen Zhi Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
description	In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure sites before destructive physical analysis of the degraded limiters.
author2	School of Electrical and Electronic Engineering
author_facet	School of Electrical and Electronic Engineering Tan, Cher Ming Yu, Wen Zhi
format	Article
author	Tan, Cher Ming Yu, Wen Zhi
author_sort	Tan, Cher Ming
title	Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
title_short	Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
title_full	Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
title_fullStr	Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
title_full_unstemmed	Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
title_sort	damage threshold determination and non-destructive identification of possible failure sites in pin limiter
publishDate	2014
url	https://hdl.handle.net/10356/103593 http://hdl.handle.net/10220/19346
_version_	1681044916585627648

Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter

Similar Items