Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter

• Main Authors: Tan, Cher Ming, Yu, Wen Zhi
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2014
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/103593; http://hdl.handle.net/10220/19346
• Institution: Nanyang Technological University

In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure...