Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter

• Main Authors: Tan, Cher Ming, Yu, Wen Zhi
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2014
• 主題: DRNTU::Engineering::Electrical and electronic engineering
• 在線閱讀: https://hdl.handle.net/10356/103593; http://hdl.handle.net/10220/19346
• 機構: Nanyang Technological University

In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure...