Al content-dependent resistive switching in Al-rich AlOxNy thin films
Resistive switching can occur in Al-rich AlO x N y thin films depending on the Al content, i.e., the films with a small Al content exhibit resistive switching, but no resistive switch is observed in the films with a large Al content. The forming voltage, set/reset voltages, currents at the low- and...
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sg-ntu-dr.10356-1039492020-03-07T14:00:35Z Al content-dependent resistive switching in Al-rich AlOxNy thin films Zhu, W. Chen, T. P. Liu, Y. Liu, Z. School of Electrical and Electronic Engineering DRNTU::Engineering::Materials::Nanostructured materials DRNTU::Engineering::Nanotechnology Resistive switching can occur in Al-rich AlO x N y thin films depending on the Al content, i.e., the films with a small Al content exhibit resistive switching, but no resistive switch is observed in the films with a large Al content. The forming voltage, set/reset voltages, currents at the low- and high-resistance states, and conduction behavior of the low-resistance state are found to be dependent of the Al content. The phenomena can be explained by the changes in the complete filaments that consist of the metallic filaments formed by Al nanophases and the non-metallic filaments formed by oxygen vacancies. 2015-01-16T02:24:24Z 2019-12-06T21:23:29Z 2015-01-16T02:24:24Z 2019-12-06T21:23:29Z 2014 2014 Journal Article Zhu, W., Chen, T. P., Liu, Y., & Liu, Z. (2014). Al content-dependent resistive switching in Al-rich AlOxNy thin films. Nanoscience and nanotechnology letters, 6(9), 835-839. https://hdl.handle.net/10356/103949 http://hdl.handle.net/10220/24647 10.1166/nnl.2014.1862 en Nanoscience and nanotechnology letters © 2014 American Scientific Publishers. |
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DRNTU::Engineering::Materials::Nanostructured materials DRNTU::Engineering::Nanotechnology Zhu, W. Chen, T. P. Liu, Y. Liu, Z. Al content-dependent resistive switching in Al-rich AlOxNy thin films |
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Resistive switching can occur in Al-rich AlO x N y thin films depending on the Al content, i.e., the films with a small Al content exhibit resistive switching, but no resistive switch is observed in the films with a large Al content. The forming voltage, set/reset voltages, currents at the low- and high-resistance states, and conduction behavior of the low-resistance state are found to be dependent of the Al content. The phenomena can be explained by the changes in the complete filaments that consist of the metallic filaments formed by Al nanophases and the non-metallic filaments formed by oxygen vacancies. |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Zhu, W. Chen, T. P. Liu, Y. Liu, Z. |
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Article |
author |
Zhu, W. Chen, T. P. Liu, Y. Liu, Z. |
author_sort |
Zhu, W. |
title |
Al content-dependent resistive switching in Al-rich AlOxNy thin films |
title_short |
Al content-dependent resistive switching in Al-rich AlOxNy thin films |
title_full |
Al content-dependent resistive switching in Al-rich AlOxNy thin films |
title_fullStr |
Al content-dependent resistive switching in Al-rich AlOxNy thin films |
title_full_unstemmed |
Al content-dependent resistive switching in Al-rich AlOxNy thin films |
title_sort |
al content-dependent resistive switching in al-rich aloxny thin films |
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2015 |
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https://hdl.handle.net/10356/103949 http://hdl.handle.net/10220/24647 |
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