A study on the evolution of dielectric function of ZnO thin films with decreasing film thickness
Dielectric function, band gap, and exciton binding energies of ultrathin ZnO films as a function of film thickness have been obtained with spectroscopic ellipsometry. As the film thickness decreases, both real (ε1 ) and imaginary (ε2 ) parts of the dielectric function decrease significantly, and ε2s...
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Main Authors: | , , , , , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2014
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/104196 http://hdl.handle.net/10220/19570 |
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Institution: | Nanyang Technological University |
Language: | English |