A study on the evolution of dielectric function of ZnO thin films with decreasing film thickness

Dielectric function, band gap, and exciton binding energies of ultrathin ZnO films as a function of film thickness have been obtained with spectroscopic ellipsometry. As the film thickness decreases, both real (ε1 ) and imaginary (ε2 ) parts of the dielectric function decrease significantly, and ε2s...

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Bibliographic Details
Main Authors: Li, X. D., Chen, T. P., Liu, P., Liu, Y., Liu, Z., Leong, K. C.
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2014
Subjects:
Online Access:https://hdl.handle.net/10356/104196
http://hdl.handle.net/10220/19570
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Institution: Nanyang Technological University
Language: English