Optical metrology under extreme conditions

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Bibliographic Details
Main Authors:	Li, Xide, Pedrini, Giancarlo, Fu, Yu
Other Authors:	Temasek Laboratories
Format:	Article
Language:	English
Published:	2014
Subjects:	DRNTU::Science::Physics::Weights and measures
Online Access:	https://hdl.handle.net/10356/104844 http://hdl.handle.net/10220/20371
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Institution:	Nanyang Technological University
Language:	English

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Summary:	Abstract is not available in fulltext.

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