Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films

Nanoscale phase separation was investigated in epitaxial strained BiFeO3thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragon...

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Main Authors: Qi, Yajun, Huang, Chuanwei, Chen, Zuhuang, Luo, Zhenlin, Wang, Yiqian, Guo, Jun, Wang, Junling, Gao, Chen, Sritharan, Thirumany, Chen, Lang, White, Timothy John
其他作者: School of Materials Science & Engineering
格式: Article
語言:English
出版: 2014
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在線閱讀:https://hdl.handle.net/10356/106101
http://hdl.handle.net/10220/20914
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機構: Nanyang Technological University
語言: English
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總結:Nanoscale phase separation was investigated in epitaxial strained BiFeO3thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones.