Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films
Nanoscale phase separation was investigated in epitaxial strained BiFeO3thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragon...
Saved in:
Main Authors: | , , , , , , , , , , |
---|---|
Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2014
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/106101 http://hdl.handle.net/10220/20914 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
id |
sg-ntu-dr.10356-106101 |
---|---|
record_format |
dspace |
spelling |
sg-ntu-dr.10356-1061012021-01-13T02:11:17Z Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films Qi, Yajun Huang, Chuanwei Chen, Zuhuang Luo, Zhenlin Wang, Yiqian Guo, Jun Wang, Junling Gao, Chen Sritharan, Thirumany Chen, Lang White, Timothy John School of Materials Science & Engineering Energy Research Institute @ NTU (ERI@N) DRNTU::Engineering::Materials Nanoscale phase separation was investigated in epitaxial strained BiFeO3thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones. Published version 2014-09-19T04:19:25Z 2019-12-06T22:04:35Z 2014-09-19T04:19:25Z 2019-12-06T22:04:35Z 2011 2011 Journal Article Qi, Y., Huang, C., Chen, Z., Luo, Z., Wang, Y., Guo, J., et al. (2011). Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films. Applied physics letters, 99(13), 132905-. 0003-6951 https://hdl.handle.net/10356/106101 http://hdl.handle.net/10220/20914 10.1063/1.3644958 en Applied physics letters © 2011 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3644958]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf |
institution |
Nanyang Technological University |
building |
NTU Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NTU Library |
collection |
DR-NTU |
language |
English |
topic |
DRNTU::Engineering::Materials |
spellingShingle |
DRNTU::Engineering::Materials Qi, Yajun Huang, Chuanwei Chen, Zuhuang Luo, Zhenlin Wang, Yiqian Guo, Jun Wang, Junling Gao, Chen Sritharan, Thirumany Chen, Lang White, Timothy John Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films |
description |
Nanoscale phase separation was investigated in epitaxial strained BiFeO3thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones. |
author2 |
School of Materials Science & Engineering |
author_facet |
School of Materials Science & Engineering Qi, Yajun Huang, Chuanwei Chen, Zuhuang Luo, Zhenlin Wang, Yiqian Guo, Jun Wang, Junling Gao, Chen Sritharan, Thirumany Chen, Lang White, Timothy John |
format |
Article |
author |
Qi, Yajun Huang, Chuanwei Chen, Zuhuang Luo, Zhenlin Wang, Yiqian Guo, Jun Wang, Junling Gao, Chen Sritharan, Thirumany Chen, Lang White, Timothy John |
author_sort |
Qi, Yajun |
title |
Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films |
title_short |
Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films |
title_full |
Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films |
title_fullStr |
Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films |
title_full_unstemmed |
Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films |
title_sort |
nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films |
publishDate |
2014 |
url |
https://hdl.handle.net/10356/106101 http://hdl.handle.net/10220/20914 |
_version_ |
1690658419741032448 |